Prof. Qiye Wen, University of Electronic Science and Technology of China, China
Ph.D Zhijiao Chen, Beijing University of Posts and Telecommunications, China
Technical Program Chairs:
Prof. Jungang Miao, Beihang University, China
Prof. Liming Si, Beijing Institute of Technology, China
Prof. Yong Wang, The Fifth Electronics Research Institute of the Ministry of Industry and Information Technology, China
Prof. Nick Ridler, NPL’s Electromagnetic & Electrochemical Technologies Department, UK
Ph.D Arshad Selamat, Universiti Kebangsaan Malaysia, Selangor, Malaysia
Prof. Xifeng Lu, Communications Technology Laboratory, NIST Boulder, CO, US
Prof. Yusong Meng, NMC, Singapore
Prof. Dazhen Gu, Communication Technology Lab National Institute of Standards and Technology Boulder, CO, USA
Prof. Guoan Wang, University of South Carolina, US
Technical Program Committee:
Prof. Xiuping Li, Beijing University of Posts and Telecommunications, China
Prof. Jiangtao Su, Hangzhou Dianzi University, China
Prof. Hongmin Lu, Xidian University, China
Prof. Zhiping Li, Beihang University, China
Prof. Wenhua Chen, Tsinghua University, China
Prof. Liyan Qiao, Harbin Institute of Technology, China
Prof. Xiangjun Li, China Jiliang University, China
Prof. Haomiao Zhou, China Jiliang University, China
Prof. Guanxiang Du, Nanjing University of Posts and Telecommunications, China
Prof. Jiangmiao Zhu, Beijing University of Technology, China
Prof. Weihua Yu, Beijing Institute of Technology, China
Prof. Chuang Yang, Beijing University of Posts and Telecommunications, China
Prof. Jinchun Gao, Beijing University of Posts and Telecommunications, China
Prof. Zihang Qi, Beijing University of Posts and Telecommunications, China
Prof. Hui Ding, Capital Normal University, China
Associate Prof. Yichi Zhang, National Institute of Metrology, China
Associate Prof. Kejia Zhao, National Institute of Metrology, China
Associate Prof. Pan Huang, National Institute of Metrology, China
Associate Prof. Xiao Liu, National Institute of Metrology, China
Associate Prof. Haoyu Lin, National Institute of Metrology, China
Associate Prof. Difei Li, National Institute of Metrology, China
Associate Prof. Zhao He, National Institute of Metrology, China
Associate Prof. Donglin Meng, National Institute of Metrology, China
