Welcome to 2025 Conference on Radio Frequency Measurement!
It's our great pleasure to invite you to join us for the 2025 Conference on Radio Frequency Measurement (CRFM 2025), which will be held on September 10-11, 2025 in Huangshan, Anhui.
CRFM 2025 is organized by the Professional Committee of Electronic Metrology, Chinese Society for Measurement (CSM).
CRFM2025 will feature parallel session tracks, workshops, and student and special sessions providing a platform for not only exchanges of innovative ideas but also opportunities for collaboration among people from academia and industry around the world.
All accepted papers will be submitted to EI Compendex and Scopus for indexation. We will recommend excellent articles for publication in journals "Microsystems and Nanoengineering" (SCI Zone 1).
Technical papers describing original work in research, development, and application of all areas in microwave and millimeter waves are solicited.
We warmly invite you to participate in CRFM 2025 and look forward to seeing you in Huangshan, Anhui!
Topic: Challenges in complex measurement environments
Sessions include but are not limited to
1. On-wafer, over-the-air or hybrid measurements: methodologies, calibration approaches and related topics
2. Calibration and uncertainty considerations in moving OTA measurements (robotics, stages, UAVs...)
3. Nonlinear characterizations, incl, linearization, of devices, circuits, and systems
4. De-embedding and calibration approaches for complex media
5. Uncertainty topics in integrated system testing
6. THz/mm-wave measurements
7. Measurement and uncertainty evaluation for space radiation and remote sensing
8. Other developments in measurements and metrology
Paper Submission Deadline: September 1, 2025
Prospective authors are invited to submit manuscripts only through (https://paper.zkhyfy.com/login/CRFM.html). The submitted paper should not have been published in other professional conferences and publications. All submitted papers must be written in English, in A4 Word format. The full text, including figures and references, is limited to 4 pages.
All accepted papers will be submitted to EI Compendex and Scopus for indexation. We will recommend excellent articles for publication in journals "Microsystems and Nanoengineering" (SCI Zone 1).
